Polytec GmbHHall 3.1 - Stand 502

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  • Optical measuring and test technology
    • Dimensional measuring technology
    • Interferometric measuring technology
    • Surface measuring technology
    • Layer thickness measuring technology

Polytec GmbH 17. April 2024
Flatness Thickness Parallelism
Combined top & bottom 3D topography in a single shot Functionality and quality of industrially manufactured components relies on well-controlled and well-monitored machining processes. Quality control, close to line or inline quality inspection often uses surface metrology for ...more
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15. May 2024 from 14:20 to 15:00 Clock
Measurement of smooth surfaces with white-light-interferometer
Polytec GmbH
Herr Dr. Özgür Tan
hall 3.1 booth 831 FORUM
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Polytec GmbH 12. April 2024
Optical 3D Surface Metrology
White-light interferometers are optical 3D surface profilers and the ideal measurement solution for inspecting functional surfaces with utmost precision and reliability. TopMap surface metrology systems measure 3D profiles, evaluating form parameters like step-height, waviness, flatness ...more
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Polytec GmbH
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