Product novelty 12. April 2024

Optical 3D Surface Metrology

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Micro.View Optical compact measuring device for surface details
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Micro.View+ Next generation optical surface profiler
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Measure surface texture and roughness with high resolution and as large area profile
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Characterize micro optics on behalf of form parameters and structural details
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TopMap optical 3D surface metrology systems
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White-light interferometers are optical 3D surface profilers and the ideal measurement solution for inspecting functional surfaces with utmost precision and reliability. TopMap surface metrology systems measure 3D profiles, evaluating form parameters like step-height, waviness, flatness and parallelism, as well as roughness and microstructures in all environments from research laboratories, close to and in production lines.
Polytec GmbH
Contact
Mr. Matthias Pauli
Visit Polytec GmbH on the Optatec 2024
Calendar appointment