Product novelty 14. April 2026

Micro.View Modular optical profiler with unrivalled repeatability

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Micro.View line of 3D optical profilers for roughness, texture and microstructures and defects with
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Micro.View line of 3D optical profilers for roughness, texture and microstructures and defects with
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Micro.View line of 3D optical profilers for roughness, texture and microstructures and defects with
TopMap Micro.View®+ is a closed loop surface profiler with unrivalled
repeatability. Designed for modularity, this comprehensive workstation allows for customized and application-specific configurations, handling up to 370 mm tall samples. The Micro.View®+ delivers crisp 3D topography data of surface roughness, texture and microstructures or MEMS with sub-nm resolution. Phase-shifting sharpens results especially on ultra smooth surfaces. Combine 3D data with Color View for enhanced documentation and visualization.

The encoded and motorized 5 port turret secures an automated transition between objectives. Add the custom TopMap 0.6x lens expanding your capabilties for high resolution form measurements. The advanced Focus Finder and Focus Tracker keep the surface reliably in focus at all circumstances. The fully motorized sample positioning stages along with True Stichting secure advanced automated workflows even on larger samples. Downsize for the smallest footprint while not sacrificing on measurement perfomance with the Compact model and stand.