Apre Instruments

Exhibition hall 3.0 – Booth I16


Contact

Apre Instruments
2440 West Ruthrauff Road
Suite 100-120
85705 Tucson AZ
USA

+1 520 639 8195

+1 860 347 6407



Product overview

Optical measuring and test technology
  • Interferometric measuring technology

New products

SPECTRALLY CONTROLLED INTERFEROMETRY - Easily measure plano-parallel optics, thin meniscus lenses and prisms without back reflections.
APRE INSTRUMENTS - Booth I16
Back reflection interference makes plano-parallel, thin meniscus lenses and prisms difficult to measure. SCI based interferometers align with laser ease and isolate surfaces like a broadband light source; electronically switching between the modes and surfaces at camera frame rates. Stop by our Stand I16 for a demonstration of how SCI can improve your production and simplify your manufacturing process control.

Contact

Donald A. Pearson II

+1 520 639 8195